Checkpoint Systems and Impinj Team to Create First ARC-Qualified RFID Inlay for the Impinj Monza R6-A RAIN RFID Chip.
SEATTLE & THOROFARE, N.J.–(BUSINESS WIRE)–Checkpoint Systems, a leading global supplier of Electronic Article Surveillance (EAS) and RFID solutions for the retail industry, and Impinj, Inc. (NASDAQ: PI), a leading provider and pioneer of RAIN RFID solutions, today announced that Checkpoint has created the first Auburn University ARC-qualified inlay incorporating the Impinj Monza R6-A chip using its own Vortex RFID label.
The ARC Program tests and benchmarks RFID tag performance and shares that data with the retail supply chain. This ensures that retail suppliers can deliver RFID-tagged products to retailers that meet or exceed the levels of performance necessary to provide benefit to both the retailer and the retail supplier. The new Vortex R6-A inlay is significant in that it is based upon the Monza R6-A tag chip, which helps retailers implement “Privacy by Design” principles to protect consumer privacy.
“As the industry enhances privacy controls, in part because of regulations such as GDPR, retailers are rethinking how to address the privacy interests of consumers,” said Carl Brasek, senior director for silicon products at Impinj. “Impinj and Checkpoint are leading the way in providing retailers with the ability to design privacy into their RAIN RFID programs while still harnessing all the benefits of a RAIN solution.”
“Checkpoint Systems has been a leader in providing retail security systems for more than 30 years,” said Craig Weakley, director of applications development, Checkpoint Systems. “The Vortex R6-A is among the first RAIN RFID inlays to be certified by Auburn University’s ARC laboratory that supports “Privacy by Design” principles. It offers security and privacy features that support retailer applications, and protect the privacy of the consumer. This product offering represents our ongoing commitment to retailers and their customers.”